Characterization of CdTe/Hg 1−x Cd x Te heterostructures by high-resolution x-ray diffraction

Author: Mainzer N.   Shilo D.   Zolotoyabko E.   Bahir G.   Sher A.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.6, 1997-06, pp. : 606-609

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Abstract