Author: Kenner Vernal Harper Brian Itkin Vladimir
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.26, Iss.7, 1997-07, pp. : 821-826
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Stress relaxation and creep in an impression test
By Li J.
Journal of Electronic Materials, Vol. 26, Iss. 7, 1997-07 ,pp. :
Stress relaxation and creep of 12 to 35 m copper foil
By Merchant H.
Journal of Electronic Materials, Vol. 26, Iss. 7, 1997-07 ,pp. :