Optical constants of Bi 2 Te 3 and Sb 2 Te 3 measured using spectroscopic ellipsometry

Author: Cui Hao   Bhat I.   Venkatasubramanian R.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.28, Iss.10, 1999-10, pp. : 1111-1114

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Abstract