In-situ evaluation of the anodic oxide growth on Hg 1−x Cd x Te (MCT) using ellipsometry and second harmonic generation

Author: Wark A.   Berlouis L.   Cruickshank F.   Pugh D.   Brevet P.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.29, Iss.6, 2000-06, pp. : 648-653

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