Author: Chauvet C. Tournié E. Vennéguès P. Faurie J.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.29, Iss.6, 2000-06, pp. : 883-886
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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