Longitudinal Light Profile Microscopy: A New Method for Seeing Below the Surfaces of Thin-Film Materials

By Power J. F.   Fu S. W.  

Applied Spectroscopy, Vol. 53, Iss. 12, 1999-12 ,pp. : 1507-1519

Society for Applied Spectroscopy

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Thermoelectric Properties and Morphology of Si/SiC Thin-Film Multilayers Grown by Ion Beam Sputtering

By Cramer Corson L.   Farnell Casey C.   Farnell Cody C.   Geiss Roy H.   Williams John D.  

Coatings, Vol. 8, Iss. 3, 2018-03 ,pp. : 109-109

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Direct Analysis of Solid Powder Samples with Electrically Vaporized Thin-Film Sampling and ICP Detection

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Applied Spectroscopy, Vol. 44, Iss. 3, 1990-03 ,pp. : 367-373

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Self-pulsations of radiation in a solid-state laser with a nonlinear thin-film Q switch

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Journal of Applied Spectroscopy, Vol. 72, Iss. 1, 2005-01 ,pp. : 146-150

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Electrochemical characterization of vacuum plasma sprayed thin-film solid oxide fuel cells (SOFC) for reduced operating temperatures

By Lang M.   Franco T.   Schiller G.   Wagner N.  

Journal of Applied Electrochemistry, Vol. 32, Iss. 8, 2002-08 ,pp. : 871-874

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