Dipole Localization and Test-Retest Reliability of Frequency and Duration Mismatch Negativity Generator Processes

Author： Frodl-Bauch T. Kathmann N. Möller H-J. Hegerl U.

ISSN： 0896-0267

Source： Brain Topography, Vol.10, Iss.1, 1997-01, pp. : 3-8

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