Benchmark experiment on void effects in a bulk shield assembly and investigation on the predictive ability of these effects by transport calculations

Author： Maekawa F.   Konno C.   Ikeda Y.   Oyama Y.   Uno Y.   Maekawa H.  

Publisher： Elsevier

ISSN： 0920-3796

Source： Fusion Engineering and Design, Vol.42, Iss.1, 1998-09, pp. : 275-280

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