Author: Staenz K. Secker J. Gao B.-C. Davis C. Nadeau C.
Publisher: Elsevier
ISSN: 0924-2716
Source: ISPRS Journal of Photogrammetry and Remote Sensing, Vol.57, Iss.3, 2002-12, pp. : 194-203
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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