Author: Zhang M. Llaser N. Devos F.
Publisher: Springer Publishing Company
ISSN: 0925-1030
Source: Analog Integrated Circuits and Signal Processing, Vol.27, Iss.1-2, 2001-04, pp. : 85-95
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement
By Portal J.
Journal of Electronic Testing, Vol. 21, Iss. 1, 2005-02 ,pp. :