Sensitivity analysis and adaptive multi-point multi-moment model order reduction in MEMS design

By Köhler Andreas  

Analog Integrated Circuits and Signal Processing, Vol. 71, Iss. 1, 2012-04 ,pp. : 49-58

Springer Publishing Company

Access to resources Recommend Favorite

Dynamic performance of maximum power point tracking circuits using sinusoidal extremum seeking control for photovoltaic generation

By Leyva R.  

International Journal of Electronics, Vol. 98, Iss. 4, 2011-04 ,pp. : 529-542

Taylor & Francis Ltd

Access to resources Recommend Favorite

Error Diagnosis of Sequential Circuits Using Region-Based Model

By D’Souza Anand  

Journal of Electronic Testing, Vol. 21, Iss. 2, 2005-04 ,pp. : 115-126

Springer Publishing Company

Access to resources Recommend Favorite

B-Spline Based, Large-Signal DC and Microwave-Model for SOI MOSFETs

By Akhtar S.   Roblin P.  

Analog Integrated Circuits and Signal Processing, Vol. 25, Iss. 2, 2000-11 ,pp. : 115-131

Springer Publishing Company

Access to resources Recommend Favorite

Structural Fault Based Specification Reduction for Testing Analog Circuits

By Chang S-J.  

Journal of Electronic Testing, Vol. 18, Iss. 6, 2002-12 ,pp. : 571-581

Springer Publishing Company

Access to resources Recommend Favorite