Local microstructure of Ge layers buried in a silicon crystal studied by extended X-ray absorption fine structure

Author： Demchenko I.N.   Lawniczak-Jablonska K.   Zhuravlev K.S.   Piskorska E.   Nikiforov A.I.   Welter E.  

Publisher： Elsevier

ISSN： 0925-8388

Source： Journal of Alloys and Compounds, Vol.362, Iss.1, 2004-01, pp. : 156-161

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