Author： Peng Y.Q.
Publisher： Springer Publishing Company
ISSN： 0947-8396
Source： Applied Physics A, Vol.78, Iss.3, 2004-02, pp. : 369-373
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Abstract
A numerical model for the current conduction in single-layer organic light-emitting devices is established under the basis of trapped charge-limited conduction with an exponential trap distribution. The dependences of the current density on the operation voltage, the thickness of the organic layer, and the trap properties are numerically studied. The current density decreases nearly exponentially with the thickness of the organic layer and the relative trap depth (l), and it is inversely proportional to the lth power of the total trap density. The results from simulations for the current–voltage characteristics agree very well with those from experiments.
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