In-plane dielectric characterization of sol–gel derived PLZT (9/65/35) thin films using an interdigital electrode configuration

Author： Wang D.Y.   Cheng Y.L.   Wang J.   Zhou X.Y.   Chan H.L.W.   Choy C.L.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.81, Iss.8, 2005-12, pp. : 1607-1611

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