Quantitative depth profile study of polyaniline films by photothermal spectroscopies

Author: de Albuquerque J.E.   Balogh D.T.   Faria R.M.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.86, Iss.3, 2007-03, pp. : 395-401

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Abstract