Smart voltammetric procedure in an automatic trace metal monitoring system for expanding the measurement range of a gold-band microelectrode array

Author： Zhang Wen Wan Hao Sun Qiyong Ha Da Wang Ping Kirsanov Dmitry Legin Andrey

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.24, Iss.4, 2013-04, pp. : 45801-45808

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