Device intended for measurement of induced trapped charge in insulating materials under electron irradiation in a scanning electron microscope

Author： Belkorissat R.   Jbara O.   Rondot S.   Benramdane N.   Belhaj M.   Hadjadj A.  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.24, Iss.5, 2013-05, pp. : 55902-55911

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