Author： Sugawara M. Hirano A. Rehak M. Nakanishi J. Kawai K. Sato H. Umezawa Y. Kyung J.M. Young S.O. En S.Y. Chang W.J.
Publisher： Elsevier
ISSN： 0957-4174
Source： Expert Systems with Applications, Vol.12, Iss.4, 1997-05, pp. : 455-464
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