Author: Schnupp R. Kuhnhold R. Temmel G. Burte E. Ryssel H. Martens J. Wets G. Vanthienen J. Mues C.
Publisher: Elsevier
ISSN: 0957-4174
Source: Expert Systems with Applications, Vol.15, Iss.3, 1998-10, pp. : 375-381
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