Building a rule-based machine-vision system for defect inspection on apple sorting and packing lines

Author: Wen Z.   Tao Y.  

Publisher: Elsevier

ISSN: 0957-4174

Source: Expert Systems with Applications, Vol.16, Iss.3, 1999-04, pp. : 307-313

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract