![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Yusa N. Chen Z. Miya K. Uchimoto T. Takagi T.
Publisher: Elsevier
ISSN: 0963-8695
Source: NDT and E International, Vol.36, Iss.7, 2003-10, pp. : 449-459
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Narishige S Nishimizu A Koike M Abe Y Narumi Y Tsuge T
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 52, Iss. 6, 2010-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Song S-J Kim Y H Kim E-L Choi Y H
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 45, Iss. 5, 2003-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)