Author: Cignini P.L. Gozzi D. Iervolino M. Latini A.
Publisher: Elsevier
ISSN: 0966-9795
Source: Intermetallics, Vol.11, Iss.11, 2003-01, pp. : 1167-1174
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
EMF Measurements of the Na-Si System
Journal of Phase Equilibria & Diffusion, Vol. 34, Iss. 6, 2013-12 ,pp. :
The physical properties of electronic materials as determined by EMF measurements
By Mikula Adolf
JOM, Vol. 59, Iss. 1, 2007-01 ,pp. :