Analysis of depth profiles of hydrogen isotopes in structural materials via reflected electron spectroscopy

Author: Afanas'ev V.   Afanas'ev M.   Batrakov A.   Bohmeyer W.   Naujoks D.   Lubenchenko A.   Markin A.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1027-4510

Source: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol.5, Iss.1, 2011-02, pp. : 70-74

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Abstract