Author: Tsai Jung-Hui Lee Ching-Sung Lour Wen-Shiung Ma Yung-Chun Ye Sheng-Shiun
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7826
Source: Semiconductors, Vol.45, Iss.5, 2011-05, pp. : 646-649
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Abstract
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