Electron irradiation controlled profile of recombination center concentration in silicon

Author： Grekhov I.   Kostina L.   Kozlovskii V.   Lomasov V.   Rozhkov A.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.37, Iss.5, 2011-05, pp. : 442-444

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