Author: Min Cui Nuofu Chen Xiaoli Yang Han Zhang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.33, Iss.2, 2012-02, pp. : 24006-24009
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract