Author: Yunfeng Chen Wei Li Haipeng Fu Ting Gao Danfeng Chen Feng Zhou Deyun Cai Dan Li Yangyang Niu Hanchao Zhou Ning Zhu Ning Li Junyan Ren
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.33, Iss.2, 2012-02, pp. : 25006-25014
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Abstract