Wavelet-based distortion measure for binary images

Author: Kim W-G   Kwon O-J   Pang H-S  

Publisher: Maney Publishing

ISSN: 1743-131X

Source: The Imaging Science Journal, Vol.61, Iss.5, 2013-06, pp. : 408-418

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract