JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6  (12-2015)

Period of time： 2015年6期

Publisher： John Wiley & Sons Inc

Founded in： 1968

Total resources： 19

E-ISSN： 1600-5767|48|6

ISSN： 0021-8898

Subject： P Astronomy and Earth Sciences

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6

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Crystallography in the 21st century: pure and applied

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1611-1613

John Wiley & Sons Inc

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Accurate strain determination from digital image correlation of Laue diffraction spots

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1614-1616

John Wiley & Sons Inc

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Inside the bulk of magnetic nanocomposites: I am not what I am

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1617-1618

John Wiley & Sons Inc

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Applications of principal component analysis to pair distribution function data

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1619-1626

John Wiley & Sons Inc

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A Rietveld refinement method for angular‐ and wavelength‐dispersive neutron time‐of‐flight powder diffraction data

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1627-1636

John Wiley & Sons Inc

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A neutron diffuse scattering study of PbZrO3 and Zr‐rich PbZr1–xTixO3

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1637-1644

John Wiley & Sons Inc

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Visualizing patterned thin films by grazing‐incidence small‐angle X‐ray scattering coupled with computed tomography

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1645-1650

John Wiley & Sons Inc

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DShaper: an approach for handling missing low‐Q data in pair distribution function analysis of nanostructured systems

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1651-1659

John Wiley & Sons Inc

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Effect of finite spatial coherence length on small‐angle scattering

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1660-1664

John Wiley & Sons Inc

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Controlled growth of large β‐BaB2O4 crystals based on theoretical guidelines

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 6 , Vol. 48, Iss. 6, 2015-12 , pp. 1665-1671

John Wiley & Sons Inc

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