JOURNAL OF MICROSCOPY,volume 205,issue 1  (01-2002)

Period of time： 2002年1期

Publisher： John Wiley & Sons Inc

Founded in： 1841

Total resources： 49

E-ISSN： 1365-2818|205|1

ISSN： 0022-2720

Subject： O Mathematical Sciences and Chemical

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JOURNAL OF MICROSCOPY,volume 205,issue 1

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Obituary

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 1-2

John Wiley & Sons Inc

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Nanosecond fluorescence resonance energy transfer‐fluorescence lifetime imaging microscopy to localize the protein interactions in a single living cell

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 3-14

John Wiley & Sons Inc

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Shearing microscopy using polarized optical microscope with shear stage and spectral analyser to study liquid crystalline polymers

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 15-20

John Wiley & Sons Inc

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Study of carbon fibres and carbon–carbon composites by scanning thermal microscopy

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 21-32

John Wiley & Sons Inc

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A metadata classification schema for semantic content analysis of videos

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 33-42

John Wiley & Sons Inc

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VANQUIS, a system for the interactive semantic content analysis and spatio‐temporal query by content of videos

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 43-52

John Wiley & Sons Inc

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Near field optical microscopy in aqueous solution: implementation and characterization of a vibrating probe

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 53-60

John Wiley & Sons Inc

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Measurement of the three‐dimensional microscope point spread function using a Shack–Hartmann wavefront sensor

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 61-75

John Wiley & Sons Inc

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Optical far‐field microscopy of single molecules with 3.4 nm lateral resolution

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 76-85

John Wiley & Sons Inc

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On the role of electron–ion recombination in low vacuum scanning electron microscopy

JOURNAL OF MICROSCOPY,volume 205,issue 1 , Vol. 205, Iss. 1, 2002-01 , pp. 86-95

John Wiley & Sons Inc

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