JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6  (06-2015)

Period of time： 2015年6期

Publisher： John Wiley & Sons Inc

Founded in： 1987

Total resources： 43

E-ISSN： 1099-128x|29|6

ISSN： 0886-9383

Subject： O Mathematical Sciences and Chemical

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JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6

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JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. i-iii

John Wiley & Sons Inc

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Populations and samples

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 325-328

John Wiley & Sons Inc

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Chemometrics‐enhanced laser‐induced thermal emission detection of PETN and other explosives on various substrates

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 329-337

John Wiley & Sons Inc

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Evaluation of smoothing techniques in the run to run optimization of fed‐batch processes with u‐PLS

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 338-348

John Wiley & Sons Inc

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A Bayesian sparse reconstruction method for fault detection and isolation

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 349-360

John Wiley & Sons Inc

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Dynamic mixture probabilistic PCA classifier modeling and application for fault classification

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 361-370

John Wiley & Sons Inc

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Sparse canonical correlation analysis applied to ‐omics studies for integrative analysis and biomarker discovery

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 371-378

John Wiley & Sons Inc

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N‐way modeling for wavelet filter determination in multivariate image analysis

JOURNAL OF CHEMOMETRICS (ELECTRONIC),volume 29,issue 6 , Vol. 29, Iss. 6, 2015-06 , pp. 379-388

John Wiley & Sons Inc

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Total 8 item(s)