Journal of Materials Research,volume 32,issue 5  (07-2016)

Period of time： 2016年5期

Publisher： Cambridge University Press

Founded in： 1986

Total resources： 436

E-ISSN： 2044-5326|32|5

ISSN： 0884-2914

Subject： TQ Chemical Industry

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Journal of Materials Research,volume 32,issue 5

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JMR volume 32 issue 5 Cover and Front matter

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2017-03 , pp. f1-f4

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JMR volume 32 issue 5 Cover and Back matter

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2017-03 , pp. b1-b6

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Introduction

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2017-03 , pp. 911-911

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Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-08 , pp. 912-920

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Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-08 , pp. 921-927

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New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-12 , pp. 928-935

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Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-12 , pp. 936-946

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An effect of crystal tilt on the determination of ions displacements in perovskite oxides under BF/HAADF-STEM imaging mode

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-10 , pp. 947-956

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3D polarization texture of a symmetric 4-fold flux closure domain in strained ferroelectric PbTiO3 films

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-07 , pp. 957-967

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Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary

Journal of Materials Research,volume 32,issue 5 , Vol. 32, Iss. 5, 2016-11 , pp. 968-982

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