Period of time: 2004年1期
Publisher: Elsevier
Founded in: 1982
Total resources: 4
ISSN: 0167-8655
Subject: TP Automation Technology , Computer Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Pattern Recognition Letters,volume 25,issue 1
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A simple and robust line detection algorithm based on small eigenvalue analysis
By Guru D.S., Shekar B.H., Nagabhushan P. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.Data augmentation and language model adaptation using singular value decomposition
By Bechet F., De Mori R., Janiszek D. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.The multiscale medial properties of interfering image structures
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.Characterization of empirical discrepancy evaluation measures
By Fernandez-Garcia N.L., Medina-Carnicer R., Carmona-Poyato A., Madrid-Cuevas F.J., Prieto-Villegas M. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.Selecting the best hyperplane in the framework of optimal pairwise linear classifiers
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.By Karacali B., Ramanath R., Snyder W.E. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.By Guru D.S., Punitha P. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.A NOVEL contour-based 3D terrain matching algorithm using wavelet transform
By Yu Q., Tian J., Liu J. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.Automatic edge detection using 3x3 ideal binary pixel patterns and fuzzy-based edge thresholding
By Kim D.-S., Lee W.-H., Kweon I.-S. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.Flat image recognition in the process of microdevice assembly
By Baidyk T., Kussul E., Makeyev O., Caballero A., Ruiz L., Carrera G., Velasco G. in (2004)
Pattern Recognition Letters,volume 25,issue 1 , Vol. 25, Iss. 1, 2004-01 , pp.