Period of time： 2013年1期
Publisher： Oxford University Press
Founded in： 1953
Total resources： 76
ISSN： 0022-0744
Subject： Q93 Microbiology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electron Microscopy,volume 45,issue 1
Menu
By Iijima Sumio,Tanaka Nobuo,Hirotsu Yoshihiko in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.
Access to resources
Recommend
Electron Nanodiffraction: Progress and Prospects
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.Recent Advances in Quantitative Convergent Beam Electron Diffraction
By Saunders Martin,Midgley Paul,Vincent Roger,Steeds John in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.Quantitative Electron Microdiffraction
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.Electron Holography of Electrostatic Fields
By Matteucci Giorgio,Missiroli Gian Franco,Pozzi Giulio in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.High Angle Dark Field STEM for Advanced Materials
By Pennycook S. J.,Jesson D. E.,McGibbon A. J.,Nellist P. D. in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.New Trends in STEM-Based Nano-EELS Analysis
By Colliex Christian in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.Atomic Resolution Electronic Structure in Silicon-Based Semiconductors
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.Interferometry by Coherent Convergent-Beam Electron Diffraction
By Tsuda Kenji,Tanaka Michiyoshi in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.By Yamamoto Naoki,Toda Akio,Axaya Katsuhiro in (1996)
Journal of Electron Microscopy,volume 45,issue 1 , Vol. 45, Iss. 1, 1996-02 , pp.
Previous
Next