Period of time: 2013年3期
Publisher: Oxford University Press
Founded in: 1953
Total resources: 76
ISSN: 0022-0744
Subject: Q93 Microbiology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electron Microscopy,volume 58,issue 3
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Advanced electron microscopy inmaterialsphysics
By Zhu Yimei,Jarausch Konrad in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Historical aspects of aberration correction
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Atomic-resolution spectroscopic imaging: past, present andfuture
By Pennycook Stephen J.,Varela Maria,Lupini Andrew R.,Oxley Mark P.,Chisholm Matthew F. in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Review of recent advances in spectrum imaging and its extension to reciprocal space
By Maign Alan,Twesten Ray D. in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM
By Inada Hiromi,Wu Lijun,Wall Joe,Su Dong,Zhu Yimei in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Control of parasitic aberrations in multipole optics
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy
By Saito Mitsuhiro,Kimoto Koji,Nagai Takuro,Fukushima Shun,Akahoshi Daisuke,Kuwahara Hideki,Matsui Yoshio,Ishizuka Kazuo in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Phase TEM for biological imaging utilizing a Boersch electrostatic phase plate: theory and practice
By Shiue Jessie,Chang Chia-Seng,Huang Sen-Hui,Hsu Chih-Hao,Tsai Jin-Sheng,Chang Wei-Hau,Wu Yi-Min,Lin Yen-Chen,Kuo Pai-Chia,Huang Yang-Shan,Hwu Yeukuang,Kai Ji-Jung,Tseng Fan-Gang,Chen Fu-Rong in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.First application of Cc -corrected imaging for high-resolution and energy-filtered TEM
By Kabius Bernd,Hartel Peter,Haider Maximilian,Mller Heiko,Uhlemann Stephan,Loebau Ulrich,Zach Joachim,Rose Harald in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in STEM
By Xin Huolin L.,Muller David A. in (2009)
Journal of Electron Microscopy,volume 58,issue 3 , Vol. 58, Iss. 3, 2009-06 , pp.