Journal of Electron Microscopy,volume 59,issue 5  (10-2013)

Period of time： 2013年5期

Publisher： Oxford University Press

Founded in： 1953

Total resources： 76

ISSN： 0022-0744

Subject： Q93 Microbiology

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Journal of Electron Microscopy,volume 59,issue 5

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Coherent electron interference from amorphous TEM specimens

By Herring Rodney A.,Saitoh Koh,Tanaka Nobuo,Tanji Takayoshi in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 321-329

Oxford University Press

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Quantitative evaluation of magnetic flux density in a magnetic recording head and pseudo soft underlayer by electron holography

By Xia Weixing,Hirata Kei,Yanagisawa Keiichi,Ishida Yoichi,Kasai Hiroto,Yanagiuchi Katsuaki,Shindo Daisuke,Tonomura Akira in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 331-337

Oxford University Press

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Morphological studies of DBSA-doped polyaniline/PVC blends

By Afzal Asma Binat,Akhtar Muhammad Javed,Ahmad Maqsood in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 339-344

Oxford University Press

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In situ SEM micro-indentation of single wood pulp fibres in transverse direction

By Adusumalli Ramesh-Babu,Raghavan Rejin,Schwaller Patrick,Zimmermann Tanja,Michler Johann in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 345-349

Oxford University Press

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Characterization of curved cathode guns by the generalized trajectory method: upgrade of G-optk programme for applications to non-planar objects

By Fujita Shin,Takebe Masahiro,Ohye Toshimi in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 351-358

Oxford University Press

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Characterization of self-healing glassy composites by high-temperature environmental scanning electron microscopy (HT-ESEM)

By Coillot Daniel,Podor Renaud,Mar Franois O.,Montagne Lionel in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 359-366

Oxford University Press

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Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

By Saitoh Koh,Yasuda Yoshifumi,Hamabe Maiko,Tanaka Nobuo in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 367-378

Oxford University Press

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Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolution

By Kim Hyonchol,Negishi Tsutomu,Kudo Masato,Takei Hiroyuki,Yasuda Kenji in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 379-385

Oxford University Press

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Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe

By Saitoh Koh,Tatara Yoshihide,Tanaka Nobuo in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 387-394

Oxford University Press

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Significance of in vivo cryotechnique for morphofunctional analyses of living animal organs

By Ohno Shinichi,Terada Nobuo,Ohno Nobuhiko,Saitoh Sei,Saitoh Yurika,Fujii Yasuhisa in (2010)

Journal of Electron Microscopy,volume 59,issue 5 , Vol. 59, Iss. 5, 2010-10 , pp. 395-408

Oxford University Press

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