Journal of Materials Science: Materials in Electronics,volume 16,issue 10  (10-2014)

Period of time： 2014年10期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 58

ISSN： 0957-4522

Subject： TB General Industrial Technology

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Journal of Materials Science: Materials in Electronics,volume 16,issue 10

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Optical nonlinearity in photonic glasses

By Tanaka Keiji in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 633-643

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Effect of the plasma surface treatment on an anatase TiO2 film

By Chiba Yoshiaki,Kokai Hideki,Kashiwagi Kunihiro in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 645-648

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Physical properties of natively textured yttrium doped zinc oxide films by sol-gel

By Kaur R.,Singh A.,Mehra R. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 649-655

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Optical, structural and electrical characteristics of aluminum oxynitride thin films deposited in an Ar-N gas mixture RF-sputtering system

By Araiza J.,Aguilar-Frutis M.,Falcony C.,Jergel Ma. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 657-661

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Improved dielectric properties in pyrochlore type oxides: Ca3Sm3−xBixTi7Nb2O26.5 (x = 1.0, 2.0 or 3.0) by Bi substitution

By Rao P.,Nair K.,Divya P.,Koshy Peter,Vaidyan V. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 663-666

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Dielectric properties of Be(IO3)2⋅4H2O crystals

By Nadoliisky M.,Georgiev M.,Nikolova D.,Karadjova V. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 667-668

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Influence of 3d-elements on dielectric properties of BaTiO3 ceramics

By Zhang Shuren,Wang Sheng,Zhou Xiaohua,Li Bo,Chen Zhu in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 669-672

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On the use of a neural network to characterize the plasma etching of SiON thin films

By Kim B.,Lee B.,Lee K. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 673-679

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Study on pore-forming agents in processing of porous piezoceramics

By Kumar B.,Kumar H.,Kharat D. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 681-686

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Structural and electrical properties of perovskite ruthenate-based lead-free thick film resistors on alumina and LTCC

By Rane S.,Prudenziati M.,Morten B.,Golonka L.,Dziedzic A. in (2005)

Journal of Materials Science: Materials in Electronics,volume 16,issue 10 , Vol. 16, Iss. 10, 2005-10 , pp. 687-691

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