Journal of Electronic Testing,volume 16,issue 5  (10-2014)

Period of time： 2014年5期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Journal of Electronic Testing,volume 16,issue 5

Menu

Editorial

By Agrawal V.D. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 403-404

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Guest Editorial

By Demidenko S. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 407-408

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Test Cycle Count Reduction in a Parallel Scan BIST Environment

By Ayari B. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 409-418

Springer Publishing Company

Abstract Access to resources Recommend Favorite

LFSR-Based Deterministic TPG for Two-Pattern Testing

By Li X. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 419-426

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits

By Higami Y. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 443-451

Springer Publishing Company

Abstract Access to resources Recommend Favorite

IDDQ Testing of Submicron CMOS—by Cooling?

By Rencz M. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 453-461

Springer Publishing Company

Abstract Access to resources Recommend Favorite

False-Path Removal Using Delay Fault Simulation

By Gharaybeh M.A. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 463-476

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Reduction of Number of Paths to be Tested in Delay Testing

By Li H. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 477-485

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Dynamic Power Supply Current Testing of CMOS SRAMs

By Liu J. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 499-511

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Testing the Local Interconnect Resources of SRAM-Based FPGA's

By Renovell M. in (2000)

Journal of Electronic Testing,volume 16,issue 5 , Vol. 16, Iss. 5, 2000-10 , pp. 513-520

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Previous 1 2 Next Display item(s) per page Total 12 item(s)