Period of time: 2014年6期
Publisher: Springer Publishing Company
Founded in: 1990
Total resources: 50
ISSN: 0923-8174
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electronic Testing,volume 17,issue 6
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Test Technology Technical Council Newsletter
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.Generation of Electrically Induced Stimuli for MEMS Self-Test
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.Fault Diagnosis for Linear Analog Circuits
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.Fault Models and Test Procedures for Flash Memory Disturbances
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.Why is Combinational ATPG Efficiently Solvable for Practical VLSI Circuits?
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.On Using Twisted-Ring Counters for Test Set Embedding in BIST
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.An Algebraic Approach to Formal Verification of Microprocessors
Journal of Electronic Testing,volume 17,issue 6 , Vol. 17, Iss. 6, 2001-12 , pp.