Journal of Electronic Testing,volume 18,issue 2  (04-2014)

Period of time： 2014年2期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 18,issue 2

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Editorial

By Agrawal V.D. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 103-104

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Test Technology Technical Council Newsletter

By Ivanov A. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 105-106

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Guest Editorial

By Landrault C. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 107-107

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Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits

By Miura Y. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 109-120

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Digital Window Comparator DfT Scheme for Mixed-Signal ICs

By de Venuto D. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 121-128

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Enhanced Reduced Pin-Count Test for Full-Scan Design

By Vranken H. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 129-143

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Hardware Generation of Random Single Input Change Test Sequences

By David R. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 145-157

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Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

By Liang H-G. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 159-170

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Using At-Speed BIST to Test LVDS Serializer/Deserializer Function

By Eckersand M. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 171-177

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RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage

By Santos M.B.,Gonçalves F.M.,Teixeira I.C.,Teixeira J.P. in (2002)

Journal of Electronic Testing,volume 18,issue 2 , Vol. 18, Iss. 2, 2002-04 , pp. 179-187

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