Period of time: 2014年1期
Publisher: Springer Publishing Company
Founded in: 1990
Total resources: 50
ISSN: 0923-8174
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electronic Testing,volume 20,issue 1
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By Agrawal Vishwani D. in (2004)
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.Test Technology Technical Council Newsletter
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.Control and Observation Structure for Analog Circuits with Current Test Data
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.A Graph-Based Approach to Power-Constrained SOC Test Scheduling
By Su Chih-Pin,Wu Cheng-Wen in (2004)
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power Constraints
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
By Chakraborty Kanad in (2004)
Journal of Electronic Testing,volume 20,issue 1 , Vol. 20, Iss. 1, 2004-02 , pp.