Journal of Electronic Testing,volume 21,issue 6  (12-2014)

Period of time： 2014年6期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Journal of Electronic Testing,volume 21,issue 6

Menu

Editorial

By Agrawal Vishwani in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 567-567

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Test Technology Newsletter

By in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 569-570

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit

By Ryu Jee-Youl in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 571-581

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors

By Lechuga Y. in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 583-598

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Multiple-Constraint Driven System-on-Chip Test Time Optimization

By Pouget Julien in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 599-611

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees

By Yotsuyanagi H. in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 613-620

Springer Publishing Company

Abstract Access to resources Recommend Favorite

A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices

By Wang Baosheng in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 621-630

Springer Publishing Company

Abstract Access to resources Recommend Favorite

The Coupling Model for Function and Delay Faults

By Yi Joonhwan in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 631-649

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Abort-on-Fail Based Test Scheduling

By Larsson Erik in (2005)

Journal of Electronic Testing,volume 21,issue 6 , Vol. 21, Iss. 6, 2005-12 , pp. 651-658

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Total 9 item(s)