Optimal experimental design of STEM measurement of atom column positions

Author： van Aert S.   den Dekker A.J.   van Dyck D.   van den Bos A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.90, Iss.4, 2002-04, pp. : 273-289

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