Fine-tuning of the focal residue in exit-wave reconstruction

By Tang D.   Zandbergen H.W.   Jansen J.   Op de Beeck M.   Van Dyck D.  

Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. : 265-276

Elsevier

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The effect of mechanical vibration and drift on the reconstruction of exit waves from a through focus series of HREM images

By Bokel R.M.J.   Jansen J.   van Dyck D.   Zandbergen H.W.  

Ultramicroscopy, Vol. 80, Iss. 4, 1999-12 ,pp. : 255-269

Elsevier

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Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function

By Lentzen M.   Urban K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 89-102

Elsevier

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Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects

By Thust A.   Coene W.M.J.   Op de Beeck M.   Van Dyck D.  

Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. : 211-230

Elsevier

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The use of through focus exit wave reconstruction in the structure determination of several intermetallic superconductors

By Zandbergen H.W.   Tang D.   Jansen J.   Cava R.J.  

Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. : 231-247

Elsevier

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