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By Chapman H.N.   Jacobsen C.   Williams S.  

Ultramicroscopy, Vol. 62, Iss. 3, 1996-02 ,pp. : 191-213

Elsevier

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Surface modification and imaging of hydrogen passivated silicon with a combined scanning electron/scanning tunneling microscope

By Coope R.J.N.   Tiedje T.   Konsek S.L.   Pearsall T.P.  

Ultramicroscopy, Vol. 68, Iss. 4, 1997-08 ,pp. : 257-266

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Optimization of scanning transmission X-ray microscopy for the identification and quantitation of reinforcing particles in polyurethanes

By Hitchcock A.P.   Koprinarov I.   Tyliszczak T.   Rightor E.G.   Mitchell G.E.   Dineen M.T.   Hayes F.   Lidy  

Ultramicroscopy, Vol. 88, Iss. 1, 2001-06 ,pp. : 33-49

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Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

By Longo D.M.   Howe J.M.   Johnson W.C.  

Ultramicroscopy, Vol. 80, Iss. 2, 1999-10 ,pp. : 69-84

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Incoherent imaging with the soft X-ray microscope

By Burge R.E.   Yuan X.-C.   Morrison G.R.   Charalambous P.   Browne M.T.   An Z.  

Ultramicroscopy, Vol. 83, Iss. 1, 2000-05 ,pp. : 75-92

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