Monitoring high-temperature solid-solid phase transitions of HMX with atomic force microscopy

Author: Weeks B.L.   Ruddle C.M.   Zaug J.M.   Cook D.J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.93, Iss.1, 2002-10, pp. : 19-23

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Abstract