Time-of-flight atom probe measurements on Ni 3 Al and Co 3 W

Author： Soer W.A.   Bronsveld P.M.   de Hosson J.T.M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.95, Iss.unknown, 2003-05, pp. : 207-213

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