A model accounting for spatial overlaps in 3D atom-probe microscopy

Author: Blavette D.   Vurpillot F.   Pareige P.   Menand A.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.89, Iss.1, 2001-10, pp. : 145-153

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Abstract