Author: Vaumousse D. Cerezo A. Warren P.J.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.95, Iss.unknown, 2003-05, pp. : 215-221
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Efficient sampling for three-dimensional atom probe microscopy data
By Hellman O.C. Rivage J.B.d. Seidman D.N.
Ultramicroscopy, Vol. 95, Iss. unknown, 2003-05 ,pp. :
Three-dimensional atomic scale microscopy with the atom probe
By Menand A. Cadel E. Pareige C. Blavette D.
Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. :
By Sebastian J.T. Rusing J. Hellman O.C. Seidman D.N. Vriesendorp W. Kooi B.J. De Hosson J.T.M.
Ultramicroscopy, Vol. 89, Iss. 1, 2001-10 ,pp. :