Author： Sebastian J.T. Rusing J. Hellman O.C. Seidman D.N. Vriesendorp W. Kooi B.J. De Hosson J.T.M.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.89, Iss.1, 2001-10, pp. : 203-213
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